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0 · Verigy to Showcase New V93000 Smart Scale Test Platform and
1 · V93000｜SoC Test Systems｜ADVANTEST
2 · V93000 SoC / Smart Scale
3 · Advantest, Verigy extend existing platforms
4 · A Smarter SmarTest: ATE Software for the Next
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Smart Test, Smart ATE, Smart Scale. The V93000 Smart Scale Generation from Advantest is .When setting up the test, the test engineer will use the level specification for all suitable .
The V93000 EXA Scale system employs Advantest's patented Xtreme Link technology, a communication network designed specifically for automatic test equipment (ATE). The technology provides high-speed data connections, . The new Pin Scale 1600 cards provide needed test coverage for complex SOC . The third new module, Verigy's new Pin Scale 9G card, combinesdata rates of up .
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications.Smart Test, Smart ATE, Smart Scale. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! High-performance, multi-site functional testing now possible at wafer probe.The V93000 EXA Scale system employs Advantest's patented Xtreme Link technology, a communication network designed specifically for automatic test equipment (ATE). The technology provides high-speed data connections, embedded computing power, and instant card-to .
When setting up the test, the test engineer will use the level specification for all suitable hardware, which could be a DC Scale DPS128, a parametric measurement unit (PMU) of a Pin Scale 1600 or a PMU of a Wave Scale MX card. The new Pin Scale 1600 cards provide needed test coverage for complex SOC devices by using Verigy's clock-domain-per-pin™, protocol-engine-per-pin™, pseudo-random bit stream (PRBS) per pin. The third new module, Verigy's new Pin Scale 9G card, combinesdata rates of up to 8 Gbps with the same per-pin functionality as the Pin Scale 1600 to maximizes pin usagewhile minimizing idle resources.
test with a single scalable platform. With every generation of digital cards the density of channels could be increased by the factor of 2. Starting from P1000 in 1999 with 16.
Verigy to Showcase New V93000 Smart Scale Test Platform and
Equipped with an A-Class test head, Pin Scale 1600 card and MB-AV8 PLUS card, the V93000 Smart Scale system offers the most economical test solutions for consumer devices. ADVANTEST’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. In addition, the testers are equipped for power supply modulation, jitter injection and protocol The Pin Scale 1600 Digital Card and Pin Scale 1600-ME (memory emulation) Card offer data rates ranging from DC to 1.6 Gb/s. The new small-form-factor cards incorporate.Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications.
Smart Test, Smart ATE, Smart Scale. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! High-performance, multi-site functional testing now possible at wafer probe.The V93000 EXA Scale system employs Advantest's patented Xtreme Link technology, a communication network designed specifically for automatic test equipment (ATE). The technology provides high-speed data connections, embedded computing power, and instant card-to .
When setting up the test, the test engineer will use the level specification for all suitable hardware, which could be a DC Scale DPS128, a parametric measurement unit (PMU) of a Pin Scale 1600 or a PMU of a Wave Scale MX card.
The new Pin Scale 1600 cards provide needed test coverage for complex SOC devices by using Verigy's clock-domain-per-pin™, protocol-engine-per-pin™, pseudo-random bit stream (PRBS) per pin. The third new module, Verigy's new Pin Scale 9G card, combinesdata rates of up to 8 Gbps with the same per-pin functionality as the Pin Scale 1600 to maximizes pin usagewhile minimizing idle resources.test with a single scalable platform. With every generation of digital cards the density of channels could be increased by the factor of 2. Starting from P1000 in 1999 with 16. Equipped with an A-Class test head, Pin Scale 1600 card and MB-AV8 PLUS card, the V93000 Smart Scale system offers the most economical test solutions for consumer devices.
ADVANTEST’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. In addition, the testers are equipped for power supply modulation, jitter injection and protocol
V93000｜SoC Test Systems｜ADVANTEST
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pin scale 1600 digital card smart test 8|A Smarter SmarTest: ATE Software for the Next